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Atomic force microscope

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Overview

Our atomic force microscope is a MFP3D-SA from Asylum Research. This AFM is able scan areas up to 90 μm x 90 μm. Both contact mode and AC mode scanning is possible in either air or liquid. The machine is also able to measure force curves and do frictional force imaging. We have an ORCA cantilever holder which allows conductive AFM imaging. Samples may have a diameter up to 4" (though 3"x1" microscope slides are easiest) and be up to 5.5 mm thick.

Getting started

To start using the AFM, please contact a qualified super user to arrange a training session. Be sure to familiarize yourself with the manual BEFORE your training.

Once you have been qualified, you may book time on the machine through the AFM booking sheet.

Users should provide their own cantilevers.

Qualified users who want a quick refresh on the steps needed for a basic scan can look here. They should also read this for some tips on scan optimization by adjusting the phase.

Links and Documents for users